On concurrent multiple error diagnosability in linear analog circuits using continuous checksum

International Journal of Circuit Theory and Applications ◽

10.1002/(sici)1097-007x(199801/02)26:1<53::aid-cta990>3.0.co;2-v ◽

1998 ◽

Vol 26 (1) ◽

pp. 53-64

Author(s):

Yingquan Zhou ◽

Mike W. T. Wong ◽

Yinghua Min

Keyword(s):

Analog Circuits ◽

Linear Analog ◽

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Generalized Multi-fractal Method for Soft Fault Feature Extraction of Non-linear Analog Circuits Based on EMD

Revista de la Facultad de Ingeniería ◽

10.21311/002.31.7.19 ◽

2016 ◽

Keyword(s):

Feature Extraction ◽

Analog Circuits ◽

Fractal Method ◽

Linear Analog ◽

Fault Feature Extraction

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FASiM: A Framework for Automatic Formal Analysis of Simulink Models of Linear Analog Circuits

2020 IEEE International Systems Conference (SysCon) ◽

10.1109/syscon47679.2020.9353652 ◽

2020 ◽

Author(s):

Adnan Rashid ◽

Ayesha Gauhar ◽

Osman Hasan

Keyword(s):

Analog Circuits ◽

Formal Analysis ◽

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Circle Equation-Based Fault Modeling Method for Linear Analog Circuits

IEEE Transactions on Instrumentation and Measurement ◽

10.1109/tim.2014.2307993 ◽

2014 ◽

Vol 63 (9) ◽

pp. 2145-2159 ◽

Author(s):

Shulin Tian ◽

ChengLin Yang ◽

Fang Chen ◽

Zhen Liu

Keyword(s):

Analog Circuits ◽

Fault Modeling ◽

Modeling Method ◽

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Hierarchical Fault Modeling for Linear Analog Circuits

The Kluwer International Series in Engineering and Computer Science - Modeling and Simulation of Mixed Analog-Digital Systems ◽

10.1007/978-1-4613-1405-9_7 ◽

1996 ◽

pp. 89-99

Author(s):

Naveena Nagi ◽

Jacob A. Abraham

Keyword(s):

Analog Circuits ◽

Fault Modeling ◽

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Efficient Fault Analysis in Linear Analog Circuits.

10.21236/ada078604 ◽

1979 ◽

Author(s):

Alfred T. Johnson ◽

Jr

Keyword(s):

Analog Circuits ◽

Fault Analysis ◽

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Verification of transient response of linear analog circuits

Proceedings 13th IEEE VLSI Test Symposium ◽

10.1109/vtest.1995.512615 ◽

2002 ◽

Author(s):

A. Balivada ◽

Y. Hoskote ◽

J.A. Abraham

Keyword(s):

Transient Response ◽

Analog Circuits ◽

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Cycling verify: fault diagnosis for linear analog circuits based on symbolic calculus and interval algebra

IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) ◽

10.1109/imtc.2002.1006908 ◽

2003 ◽

Author(s):

F. Filippetti ◽

M. Artioli

Keyword(s):

Fault Diagnosis ◽

Analog Circuits ◽

Symbolic Calculus ◽

Interval Algebra ◽

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Minimizing Test Frequencies for Linear Analog Circuits: New Models and Efficient Solution Methods

IFIP Advances in Information and Communication Technology - VLSI-SoC: At the Crossroads of Emerging Trends ◽

10.1007/978-3-319-23799-2_9 ◽

2015 ◽

pp. 188-207

Author(s):

Mohand Bentobache ◽

Ahcène Bounceur ◽

Reinhardt Euler ◽

Salvador Mir ◽

Yann Kieffer

Keyword(s):

Analog Circuits ◽

Efficient Solution ◽

Linear Analog ◽

Solution Methods

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A method for multiple soft fault diagnosis of linear analog circuits

Measurement ◽

10.1016/j.measurement.2018.09.001 ◽

2019 ◽

Vol 131 ◽

pp. 714-722 ◽

Author(s):

Michał Tadeusiewicz ◽

Stanisław Hałgas

Keyword(s):

Fault Diagnosis ◽

Analog Circuits ◽

Linear Analog ◽

Soft Fault Diagnosis

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FLYER: fast fault simulation of linear analog circuits using polynomial waveform and perturbed state representation

Proceedings Tenth International Conference on VLSI Design ◽

10.1109/icvd.1997.568166 ◽

2002 ◽

Author(s):

P.N. Variyam ◽

A. Chatterjee

Keyword(s):

Analog Circuits ◽

Fault Simulation ◽

State Representation ◽

Perturbed State ◽

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